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The JEOL Analytical Electron Microscopy & Surface Analysis Centre

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JEOL UK has partnered with The University of Dundee to set-up the JEOL Analytical Electron Microscopy & Surface Analysis Centre.

This new Centre will be formally opened late Summer 2006.

Many improvements/upgrades in the works as a result of the partnership mentioned above. Watch this space!!


Electron Microscopy Suite: SEM, TEM & E-beam Lithography Facilities

Scanning Probe Suite: AFM, STM, SCM, MFM and more

Surface Analysis Suite : XPS, AES, SIMS, and ToF SIMS

Other Chemical Analysis: HPLC and Absorption Analysis

Surface Coatings and Sample Preperation

 

Services offered by the Centre.

This page is maintained by the Nanoscale Materials Research Laboratory.